Regional Centre for Special Optics and Optoelectronic Systems TOPTEC
Optics and Measurement 2012
16.10.2012 - 18.10.2012
Hotel Ještěd, Liberec, (Czech Republic)
Contents
Contributions |
Page |
| SCANNING ELECTRON MICROSCOPY OF THE THIN LAYERS OF SILICON CARBIDEALUMINUM NITRIDE SOLID SOLUTION FORMATTED BY SUBLIMATION EPITAXY Dallaeva D., Tomanek P., Korostylev E. and Bilalov B. |
5 |
| DIGITAL HOLOGRAPHIC SETUP FOR MEASUREMENT OF ASYMMETRIC TEMPERATURE FIELD AND TOMOGRAPHIC RECONSTRUCTION Doleček R., Kopecký V., Psota P. and Lédl V. |
9 |
| HOLLOW-DUCT RADIATION DELIVERY SYSTEM INVESTIGATION Fibrich M., Rus B.and Kramer D. |
13 |
| CONCEPTS FOR AN ACTIVE INSPECTION OF THREE-DIMENSIONAL OBJECTS USING A MULTI-SENSOR MEASUREMENT SYSTEM Gronle M., Lyda W. and Osten W. |
17 |
| REDUCING THE EDGE CHIPPING FOR CAPILLARY END FACE GRINDING AND POLISHING Hošek J.and Studenovský K. |
24 |
| HISTORY OF DEVELOPMENT OF X-RAY OPTICS IN CZECH REPUBLIC Inneman A., Pína L., Hudec R., Černá D., Maršíková V. and Melich Z. |
28 |
| MEASUREMENT OF FLUID MOTION AND TEMPERATURE CHANGES IN THE REAL MODEL OF THE HEAT EXCHANGER USING PLIF Jašíková D., Pavlík D., Kotek M. and Kopecký V. |
34 |
| NOVEL STITCHING INTERFEROMETRY FOR THE MEASUREMENT OF LARGE FLATS King Ch. W. and Simpson P. |
41 |
| PREPARATION, PROPERTIES AND APPLICATION OF SAPPHIRE SINGLE-CRYSTAL FIBERS GROWN BY THE EFG METHOD Klejch M., Němec M. , Kubát J. and Polák J. |
48 |
| DEVELOPMENT OF LARGE APERTURE ELEMENTS FOR ACTIVE AND ADAPTIVE OPTICS Kmetík V., Němcová S., Jiran L., Stranakova E. and Inneman A. |
53 |
| LIGHTING MOLDED OPTICS: DESIGN AND MANUFACTURING Kočárková H. |
57 |
| DESIGN OF HYBRID COMPRESSOR FOR A 10PW LASER Kramer D., Novák J. and Rus B. |
66 |
| OPTIMIZATION OF ELECTRODE GEOMETRY AND PIEZOELECTRIC LAYER THICKNESS OF A DEFORMABLE MIRROR Kruchenko A.V., Nováková K. and Mokrý P. |
69 |
| HIGH FREQUENCY MODULATION METHOD FOR MEASURING OF BIREFRINGENCE Kunc Š. and Šulc M. |
74 |
| REAL-TIME MEASUREMENTS OF DIFFRACTION GRATING GROWTH IN PHOTOPOLYMER RECORDING MATERIALS Květoň M., Havránek A., Škereň M. and Fiala P. |
77 |
| PRECISION DISPLACEMENT INTERFEROMETRY WITH STABILIZATION OF WAVELENGTH ON AIR Lazar J., Holá M., Hrabina J., Buchta Z. and Číp O. |
81 |
| IRREGULAR SURFACES - MEASUREMENTS AND ZEMAX SIMULATIONS Melich R., Psota P., Lédl V. and Václavík J. |
86 |
| TECHNIQUE FOR SURFACE SHAPE RECONSTRUCTION USING DEFLECTOMETRIC PRINCIPLE Mikš A., Novák J. and Novák P. |
89 |
| ADAPTIVE OPTICS FOR CONTROL OF THE LASER WELDING PROCESS Mrňa L., Šarbort M., Řeřucha Š. and Jedlička P. |
93 |
| PHOTONOMETERS FOR COATING AND SPUTTERING MACHINES Oupický P., Jareš D., Václavík J. and Vápenka D. |
99 |
| RELATIONSHIP BETWEEN LUMINOSITY, IRRADIANCE AND TEMPERATURE OF STAR ON THE ORBITAL PARAMETERS OF EXOPLANETS Pintr P. |
103 |
| USING FEM TECHNOLOGY FOR OPTICAL SURFACES POLISHING Procháska F., Polák J., Tomka D. and Šubert E. |
107 |
| DIGITAL HOLOGRAPHIC METHOD FOR PIEZOELECTRIC TRANSFORMERS VIBRATION ANALYSIS Psota P., Kopecký V., Lédl V. and Doleček R. |
112 |
| MULTIPLE WAVELENGTH GENERATION USING A COMPACTED HYBRID RAMAN / BI-EDF AMPLIFIER Shirazi M.R. and Biglary M. |
118 |
| MULTIPLE MIRROR POSITION MONITORING SYSTEM FOR PARTICLE DETECTOR RICH-1 Steiger L. and Šulc M. |
121 |
| FABRICATION OF DIFFRACTIVE ELEMENTS USING MATRIX LASER LITHOGRAPHY Škereň M., Svoboda J., Květoň M. and Fiala P. |
124 |
| DIFFRACTIVE ELEMENTS FOR CORRECTION OF CHROMATIC ABERRATIONS OF ILLUMINATION SYSTEMS Škereň M., Svoboda J., Květon M., Fiala P., Hopp J. and Possolt M. |
129 |
| EVALUATION OF LENGTH OF THE FABRY-PEROT CAVITY WITH ULTRA-LOW EXPANSION SPACER WITH OPTICAL FREQUENCY COMB Šmíd R., Čížek M. and Číp O. |
132 |
| OPTOELECTRONIC DIAGNOSTICS OF DEFECTS IN SOLAR CELL STRUCTURES Tománek P., Škarvada P., Grmela L. and Dallaeva D. |
137 |
| NANOSCRATCH TEST – A TOOL FOR EVALUATION OF COHESIVE AND ADHESIVE PROPERTIES OF THIN FILMS AND COATINGS Tomáštík J. and Čtvrtlík R. |
141 |
| GALLIUM PHOSPHIDE AS A MATERIAL FOR VISIBLE AND INFRARED OPTICS Václavík J. and Vápenka D. |
145 |
| DESIGN AND FABRICATION OF ANTI-REFLECTION COATING ON GALLIUM PHOSPHIDE SUBSTRATE FOR VISIBLE AND INFRARED APPLICATION Vápenka D. and Václavík J. |
149 |
| SURFACE STATES IN PHOTONIC CRYSTALS Vojtíšek P. and Richter I. |
151 |
